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Diamond Series Test Platform

Next Generation Test Platform for SOC, Flat Panel Display Driver, and MCUs

The Diamond Series offers breakthrough cost reductions in both capital and operating costs for the mobility, connectivity, consumer, automotive and industrial markets.

Broadly deployed at major IDMs and OSATs, and field-proven performance in each of its target markets, the lower capital cost as compared to competitive alternatives, high throughput and low operating costs of the Diamond allows customers the ability to meet their lowest cost of ownership and cost per device test targets.

Cohu Diamondx Test System

Diamondx Test System

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

DxV Test System

Changes the Rules of Design Through to Production Test

Diamondx Instrumentation

A variety of instruments suitable for RF Wireless, Mobility, SOC, Flat Panel Display drivers, Power Management, and Microcontrollers

Wireless / RF Instrumentation

RF test solutions for 4G, 5G, ku-band and beyond, for 802.11AC, 802.11ax standard, LTE-A, HSPDA, WCDA, GSM, Edge, WCDMA and Bluetooth.


Learn more about our Semiconductor ATE Solutions