Diamond Series Test Platform
Next Generation Test Platform for SOC, Flat Panel Display Driver, and MCUs
The Diamond Series offers breakthrough cost reductions in both capital and operating costs for the mobility, connectivity, consumer, automotive and industrial markets.
Broadly deployed at major IDMs and OSATs, and field-proven performance in each of its target markets, the lower capital cost as compared to competitive alternatives, high throughput and low operating costs of the Diamond allows customers the ability to meet their lowest cost of ownership and cost per device test targets.
