The NY32-LU provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
- 1D/2DMC code reader
- 2D/3D Flex ball/bump co-planarity
- Mark, Surface, 5S, Color Vision
- In-Tape, Post Sealing Inspection
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