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System Level Test Burn-in Solution

High volume System-Level Test that is affordable for long test times.

Parallelism up to 396 DUTs to achieve a throughput of up to 5,000 units per hour (UPH).

Combine this throughput with a small factory floor footprint to achieve the industry’s lowest cost of system-level test.

Cohu Solstice System Level Test Handler
  • High Throughput

    • Up to 5,000 UPH at 4 min. Test Time
    • Approx. 15,000 UPH of legacy SLT
    • Efficiency features – Auto retest, lot-cascading, multi-lot mode

  • Tri-Temp Thermal Control

    • Best-in-class thermal control
    • T-Core Active Thermal Control (ATC) architecture
    • Refrigerant based evaporative cooling capability
    • 0 °C to 130 °C test range
    • Single insertion multi-temp testing capability
    • Chamberless asynchronous testing
  • High Density Testing

    • Up to 396 site parallelism with Active Thermal Control (ATC)
    • Small footprint 8.5 m²
    • Zero footprint adder for tri-temp thermal control capability
  • Available Options

    • Tri-Temp 0 °C to 130 °C
    • Vision 2DID for DUT traceability
    • Auto PNP Teach (IOVA)


Learn more about our Test Handler and Inspection Solutions