ICON Coaxial
Test Contactor
Optimized for HPC/AI Devices
Optimized for HPC/AI Devices
Ideal for FPGA, GPU, SerDes, PAM4, DDR, PCIe, HDMI, 800G and 1.6T Ethernet.
The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).
The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.
With data rates up to 224 Gbps and bandwidths exceeding 60 GHz, ICON is ideal for FPGA, GPU, SerDes, DDR, PAM4, HDMI, PCIEx, HDMI, 800G and 1.6T Ethernet, SATCom, 5G mmWave RF Transceivers.
Supports silicon photonics integration for optical engine and CPO testing.
Supports fine-pitch applications from 0.3 mm to 1.0 mm, and device sizes up to 120 mm x 120 mm and beyond. Suitable for BGA / LGA. Singulated devices, strip test, or wafer test. Enabling reliable testing from compact ICs to large high-pin count packages.
Coaxial design with aluminum shielding reduces cross talk and electromagnetic interference. Signal paths completely surrounded by ground from DUT to PCB pad. Ensures clean signal transmission even at extreme speeds.
Aluminum body delivers exceptional thermal conductivity and mechanical rigidity. Field repairable standardized high compliance probes and snap-in insulators.
Maintains native impedance from the device-under-test (DUT) to the test system, minimizing signal reflections and maximizing high-frequency power transfer.
Current carrying capacity up to 2.7 A continuous.
Temperature range -55 ̊C to +155 ̊C.
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