MX Test System
40 Instrument Slots, up to 512 Digital Pins
MX Test System configuration is architected to provide optimal cost of test for advanced RF wireless, power management, computing and automotive devices. It offers high configurability, with small instrument channel increments, to produce system configurations with a lower cost of test than competitive platforms. The MX offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.
The MX is part of the X-Series which offer three different configurations, all based off the same instrumentation, software, system architecture and DUT interface. The major difference between the various configurations is the slots available for instrumentation.