InFlip MEMS Strip Test Module
High Parallel Test of Inertial Sensors up to 6DOF
InFlip MEMS strip-test module incorporates a modular architecture designed to replace expensive custom-designed machinery. It can operate in a standalone mode or it can be configured with a Cohu InStrip platform for full automation.
The InFlip module can also be upgraded to perform magnetometer test for a full 6DOF device. It supports tests over the -40°C to +125°C temperature range. Access rotation velocity is approximately 180° per second. Index time is 0.6 s; strip exchange time is 11 s.