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InFlip MEMS Strip Test Module

High Parallel Test of Inertial Sensors up to 6DOF

InFlip MEMS strip-test module incorporates a modular architecture designed to replace expensive custom-designed machinery. It can operate in a standalone mode or it can be configured with a Cohu InStrip platform for full automation.

The InFlip module can also be upgraded to perform magnetometer test for a full 6DOF device. It supports tests over the -40°C to +125°C temperature range. Access rotation velocity is approximately 180° per second. Index time is 0.6 s; strip exchange time is 11 s.

Cohu MEMS Test Handler
  • Stimuli Module

    • Accelerometer
    • Compass
    • Tri-temp

  • Applications

    • Inertial sensors such as accelerometers with or without magnet, 3DOF and 6DOF combos
    • Other MEMS applications on request
  • Features

    • High parallel test in composites, i.e. strips or carriers
    • Scalable modular architecture: convertible to various sensor applications and package types
    • Supports a large variety of packages including tiny and fragile packages
    • Robust handling with minimum number of device contacts and low jam rates
    • Real-world (physical) sensor stimulus with high accuracy
  • Solutions for

    • All leaded and leadless packages, including tiny and fragile devices
    • Typical carrier size 215 mm x 65 mm
    • Tri-temp test from -40°C to +125°C