• Careers
  • Help Center
  • Login
cohu.com
MENUMENU
  • Products
    • Test Handlers
      • Pick-and-Place
        • Eclipse
        • MATRiX
        • MT9510
      • Gravity
        • MT9928 xm
        • Rasco SO1000
        • Rasco SO2000
      • Turret Test and Scan
        • Ismeca NY20
        • Ismeca NY32
        • Ismeca NY32W
        • Neon
        • Wide Bandgap Test Solutions
      • MEMS and Sensor Test
        • Sense+ Automation Platform
        • Inertial Test
        • Magnetic Sensor Test
        • Microphone Test
        • Optical Sensor Test
        • Pressure Test
      • Markets
        • Automotive
        • Computing
        • Consumer
        • Industrial
        • IoT/IoV and Optoelectronics
        • Mobile

      • Test Handler Solutions

        Test Handler Group

        Read More
      • Thermal
        • T-Core Active Thermal Control
        • Temperature Chambers
      • High Parallel Test
        • Film Frame FH-1200
        • InCarrier
        • Laser Mark MH-3300
        • NY32-LU
        • Rasco Jaguar
        • Sense+ Automation Platform
        • SH-5300
      • Smart Factory Automation
    • Semiconductor Testers
      • Application Solutions
        • Automotive
        • Consumer
        • Flat Panel Display
        • Industrial
        • Internet of Things
        • Microcontrollers
        • Mobile
        • Power Management
        • Wireless / RF
      • Test Systems
        • Diamondx
        • Diamondx DxV
        • PAx
      • Instrumentation
        • Diamondx Instrumentation
        • PAx Instrumentation
        • Wireless / RF Instrumentation
      • EducATE
      • Application Services
        • Software

      • Semiconductor Tester Solutions

        Semiconductor ATE

        Read More
    • Interface Solutions
      • Key Test Requirement
        • Automotive and Power
        • High End Digital
        • Mobile
        • Precision Analog and Sensors
        • RF
      • Package Type
        • BGA
        • QFN / DFN / MLF
        • QFP
        • SO
        • WLCSP
        • ECT Industrial Contacts
        • Kita Advanced Spring Probes
      • Interface Products
        • ACE Contactor / Probe Head
        • Atlas Contactor / Probe Head
        • cBoa Contactor / Probe Head
        • cCompact Kelvin Contactor
        • cCruiser Contactor
        • cDragon Contactor
        • cGator Contactor
        • cHybrid Turret Contactor
        • cPython Contactor / Probe Head
        • cRacer Contactor / Probe Head
        • cViper Probe Head
        • ecoAmp Kelvin Contactor
        • E-Series Spring Probe Contactor
        • Gemini Kelvin Contactor / Probe Head
        • Hydra Contactor / Probe Head
        • ICON Coaxial Contactor
        • Mercury Contactor / Probe Head
        • MiCon Contactor
        • nanoKelvin Contactor
        • RF Scrub Contactor
        • ULTRA-S Contactor
        • Wafer Probe Cards
        • xWave Contactor / Probe Head

      • Interface Solutions

        Interface Solutions Group

        Read More
      • Interface Technology
        • Cantilever
        • Kelvin
        • Spring Probe
    • Inspection and Metrology
      • WLCSP Inspection
        • Neon
      • Package Inspection
        • Krypton
        • Ismeca NY20
        • Ismeca NY32
      • NV-Core Inspection System
        • 3D Flex Vision System
        • Aquilae HR Sidewall Module
        • Aquilae Infrared Module
      • Markets
        • Automotive
        • Computing
        • Consumer
        • IoT/IoV and Optoelectronics
        • Industrial
        • Mobile

      • Inspection and Metrology Solutions

        Test Handler Group

        Read More
  • Software Analytics
    • Software Analytics
      • DI-Core Data Intelligence System
        • About DI-Core
        • AI Inspection
        • InSight
        • Predictive Maintenance
        • SmartTrak
      • Tignis, a Cohu Analytics Solution
        • About Tignis
        • PAICe Monitor
        • PAICe Maker
        • Case Studies
        • Tignis Blog
        • Tignis Careers
        • Request a Demo
      • Industries
        • Semiconductor Components and Material Suppliers
        • Semiconductor Equipment Manufacturers
        • Semiconductor Fabricators
  • Expertise
    • Expertise
      • Markets
        • Automotive
        • Computing
        • Consumer
        • Industrial
        • IoT/IoV and Optoelectronics
        • Mobile
      • Data Analytics
        • DI-Core
        • Tignis
      • Expert Papers
        • EducATE Knowledge Center
        • Technical Papers
        • Tignis Blog
      • Test Cell Solutions
        • DI-Core
        • Wide Bandgap Test Solutions
      • Expertise

  • Sales and Service
    • Sales and Service
      • Customer Platforms
        • Customer Portal
        • EducATE Knowledge Center
      • Support
        • Help Center
        • Contact Sales
        • Contact Service
        • Locations
      • Service Offerings
        • Service Based Support (SBS)
        • OEM Protect Program
        • Boost Installed Base ROI
        • Reduce Spares Turnaround
        • Refurbished ATE Equipment
      • Training Offerings
        • Handler and Inspection Training
        • Tester Training
      • Sales and Service

  • Company
    • Company
      • Our Company
        • About Us
        • Cohu History
        • Leadership Team
        • Locations
      • Environment, Social & Governance
        • Corporate Responsibility
        • Corporate Sustainability
      • News and Events
        • Industry Events
        • Press Releases
      • Investor Relations
        • Investor Overview
        • Documents and Charters
        • Board of Directors
        • Annual Reports
        • SEC Filings
        • Press Releases
        • Stock Information
      • Careers
        • Careers at Cohu
        • Working at Cohu
        • Our Culture
        • Search Job Opportunities
        • Students and Co-Ops
        • Policies
        • Ausbildung – Studenten
        • Recruiters
      • Company

  • Click to open the search input field Click to open the search input field Search
You are here: Home1 / Tignis

PAICe-press-release-thumbnail

Screen-Shot-2021-09-20-at-10.21.24-AM

Screen-Shot-2021-09-08-at-4.41.16-PM

paice-builder

PAICe-Builder-Rod-Pump-Use-Case-banner-

Microchip-Billboard_cr_for-blog_1200

mitre-engenuity-semiconductor-alliance-blog-post-featured-image-q1793z8e87hby3ypkbu45ysdajaa4f9paj189w1d2g

AnjuDtech-Blog-Banner-2-px39phj3nw8dgmjkz294k4auvghphf6w3j1fy1s414

Director-of-Semiconductor-Solutions-banner-image-1

Blog-image-for-Optimum-PR_cr

Page 7 of 13«‹56789›»

Products

  • Test Handlers
  • Semiconductor Testers
  • Interface Solutions
  • Inspection and Metrology
  • DI-Core Data Intelligence System
  • Tignis, a Cohu Analytics Solution

Expertise

  • Automotive
  • Consumer
  • Computing
  • Industrial
  • IoT/IoV and Optoelectronics
  • Mobility

Sales and Service

  • Customer Portal
  • EducATE Knowledge Center
  • Contact Sales
  • Help Center
  • Locations
  • Service Offerings
  • Training

Company

  • About Us
  • Careers
  • Corporate Responsibility
  • Corporate Sustainability
  • Events
  • Investor Relations
  • Press Releases
© Cohu, Inc 2025
  • Imprint
  • Legal Disclaimer
  • Privacy Policy
Scroll to top Scroll to top Scroll to top
  • Products
    ▼
    • Test Handlers
      ▼
      • Pick and Place
        ▼
        • Eclipse
        • MATRiX
        • MT9510
      • Thermal
        ▼
        • T-Core Active Thermal Control
        • Temperature Chambers
      • Gravity
        ▼
        • MT9928
        • Rasco SO1000
        • Rasco SO2000
        • SH-5300
      • High Parallel Test
        ▼
        • FH-1200
        • InCarrier
        • MH-3300
        • NY32-LU
        • Rasco Jaguar
        • Sense+ Automation Platform
      • MEMS and Sensor Test
        ▼
        • Sense+ Automation Platform
        • Inertial Test
        • Magnetic Sensor Test
        • Microphone Test
        • Optical Sensor Test
        • Pressure Test
      • Turret Test and Scan
        ▼
        • Ismeca NY20
        • Ismeca NY32
        • Ismeca NY32W
    • Semiconductor Testers
      ▼
      • Application Solutions
      • EducATE Knowledge Center
      • Test Systems
        ▼
        • Diamondx
        • Diamondx DxV
        • PAx
      • Instrumentation
        ▼
        • Diamondx Instrumentation
        • PAx Instrumentation
        • Wireless / RF Instrumentation
      • Software
    • Interface Solutions
      ▼
      • Key Test Requirement
      • Interface Technology
      • Package Type
      • Probe Cards
      • Test Contactors
      • Kita Advanced Spring Probes
      • ECT Industrial Contacts
    • Inspection and Metrology
      ▼
      • Package Inspection
        ▼
        • Krypton
        • Ismeca NY20
        • Ismeca NY32
      • WLCSP Inspection
        ▼
        • Neon
      • NV-Core Inspection System
        ▼
        • 3D Flex Vision System
        • Aquilae HR Sidewall Module
        • Aquilae Infrared Module
  • Software Analytics
    ▼
    • DI-Core Data Intelligence System
      ▼
      • Artificial Intelligence Inspection
      • Predictive Maintenance
      • Insight
      • SmartTrak
    • Tignis, a Cohu Analytics Solution
      ▼
      • PAICe Maker
      • PAICe Monitor
      • Case Studies
      • Tignis Blog
      • Tignis Careers
      • Request a Demo
  • Expertise
    ▼
    • Markets
      ▼
      • Automotive
      • Computing
      • Consumer
      • Industrial
      • IoT/IoV and Optoelectronics
      • Mobile
    • EducATE Knowledge Center
    • Technical Papers
    • Smart Factory Automation
    • Wide Bandgap Test Solutions
  • Sales and Service
    ▼
    • Help Center
    • Customer Portal
    • EducATE Knowledge Center
    • Service Offerings
    • Training Offerings
  • Company
    ▼
    • Our Company
      ▼
      • About Us
      • About Cohu
      • Cohu History
      • Corporate Responsibility
      • Corporate Sustainability
      • Leadership Team
      • Locations
    • Careers
      ▼
      • Careers at Cohu
      • Working at Cohu
      • Culture
      • Students and Co-Ops
      • Search Job Opportunities
    • Events
    • Investor Relations
    • Press Releases