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Interface Solutions for High End Digital

Empowering the growth of artificial intelligence, virtual and augmented reality.

Coaxial solutions providing exceptional signal isolation and impedance control, scalable for large package platforms up to 60 Gpbs.


Device Requirements


  • Large array packages
  • Bandwidth to support fast edge rates
  • Low inductance for clean power delivery during output switching
  • Low noise for low voltage edge trigger deteection
  • High pin-to-pin isolation


Contactor Requirements


  • High compliance (>0.4 mm)
  • Low force (>20 g)
  • Low contact resistance (>50 mΩ)
  • High current (150 A)


Applications


  • Processors: microprocessors, graphics processors, application processors
  • Logic: ASICs, PLDs, FPGAs, and display drivers

Test Contactor (Socket) / Probe Head Solutions


Cost-Effective, High-Performance Contactor or Probe Head for High-Volume Production Test

cBoa contactors and probe heads are the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogenous DUT side plunger provides longer run times between cleaning and increased probe life.

The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 27 GHz, cBoa can be used to test some of the highest frequency devices.

The enhanced compliance window accommodates package stack height tolerances well.

Read More about the cBoa Contactor and Probe Head

Custom Probes and Test Contactor Solutions up to 60 GHz

Our E-Series® probes offer a comprehensive portfolio designed for versatile testing applications—from bare boards to surface mount assemblies and more. Whether you need off-the-shelf options or fully customized solutions, we deliver performance, reliability, and value.

Providing test probe solutions, probe customization services and failure analysis capability are part of our core competencies.

Read More about the E-Series Spring Probe Contactors

Common Test Height Probe Product Line.

Engineered for excellence and efficiency, HYDRA™ spring probe series offers precision, reliability, and standardized semiconductor test interface. Designed to be best-in-class at a competitive price point, HYDRA is optimized to maximize your operational efficiency. HYDRA is built to withstand demanding high-volume manufacturing test environments with its robust and durable design. With a common test-height, HYDRA offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, HYDRA streamlines inventory management with fewer probe part numbers to manage and shorter lead times.

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Coaxial production solution for testing high end digital applications to 60 Gbps

Designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).

The HYDRA COAX’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise).

Read More about the HYDRA COAX Contactor

Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz

HYDRA RF utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.

HYDRA RF features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.

Read More about the HYDRA RF Contactor and Probe Head

Industry preferred high performance, high value, low cost QuadTech contacting solution

Mercury probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields. Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

Read More about the Mercury Contactor and Probe Head

Expertise

Learn more about our Interface Solutions.