Highly Configurable Scalable Pick and Place Handler
Eclipse XT delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high performance mobile processors. The Eclipse XT is a high speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -55°C to +155°C*, with throughput up to 13,000 units per hour.
Featuring Cohu’s proprietary T-Core thermal controller and a variety of cooling systems in order to provide precise, multi-site temperature management of power dissipative ICs, optimizing test yield of next generation IC’s. It also enables both IDM and Fabless customers to test high-end processors used in augmented virtual reality and deep-learning applications, giving continuity to Cohu’s leadership in advanced thermal test. Eclipse XT offers flexibility for both OSATs, IDM and Fabless customers with its wide market coverage through field configurability.
*device type dependent