Contact Sales
Complete our contact form.
A variety of instruments make the Diamondx suitable for testing today’s Wireless, Mobility, SOC, Flat Panel Display Drivers, Power Management, and Microcontrollers for the Automotive, Mobility, IoT/IoV and Optoelectronics, Data Center, Cloud and AI, Industrial and Medical, and Consumer markets.
AT1x - Automotive Test Composite Pin
AT1xTM
Automotive test composite pin
- Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
- Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
- Transient detect capability to capture perturbations at the device in program development or production test
ATMPx - Analog Time Measurement Processor
ATMPxTM
Analog time measurement processor
- Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
- Reduced loadboard complexity using the SmartMux for high voltage timing measurements
PD1x/PD2x - Test Solution for Ultra-High Definition Display Driver ICs
PD1xTM/ PD2xTM
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PD3x - High Density Digitizer
PD3xTM
Test solution for ultra-high definitive display driver ICs
- 320 channels per board
- Low Voltage High Accuracy Measurement
- Active Load Support for Better Test Coverage
- Per Pin Comparator, TMU, PMU provides Faster Test Time for Higher Throughput
- Integrated Digital Use Model for Faster Time to Yield
VI1x - Precision Voltage/Current Source and Measurement
VI1xTM
Precision voltage/current source and measurement with advanced features for automotive and industrial devices
- Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
- A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
- A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument
DPS1x - High-Performance Device Power Supply
DPS1xTM
High-performance device power supply
- Multisite testing of multi-core application processors and other high current, low voltage devices
- Drop-in replacement for DPS16 with enhanced capabilities
DPS16 - 16-Channel Device Power Supply
DPS16TM
16-channel device power supply
- Continuous voltage source
- Voltage and current measurement
FPVIx - High-Voltage, High-Current Floating Programmable
FPVIxTM
High-voltage, high-current floating programmable power supply
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
- Expert mode to maximize energy efficiency of the instrument
HDVI - High-Density Voltage Current Instrument for Massive Multisite
HDVITM
High-density voltage current instrument for massive multisite test
- Highest V/I pin density in the industry
- Voltage/current supply (VIS) mode
- Precision analog source (PAS) mode
- Flexible triggering options
- External input matrix
HPVIx - High-Power Voltage/Current Programmable Power Source
HPVIxTM
High-power voltage / current programmable power source
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
PD2x - Test Solution for Ultra-High Definition Display Driver ICs
PD2xTM
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PD3x- High Density Digitizer
PD3xTM
Test solution for ultra-high definitive display driver ICs
- 320 channels per board
- Low Voltage High Accuracy Measurement
- Active Load Support for Better Test Coverage
- Per Pin Comparator, TMU, PMU provides Faster Test Time for Higher Throughput
- Integrated Digital Use Model for Faster Time to Yield
PMVIx - Voltage/Current Source
PMVIxTM
Voltage /current source for mobile, power management, SOC, automotive and MCU ICs
- Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps
VIS16 - Precision Voltage/Current Source and Measurement
VIS16TM
Precision voltage / current source and measurement with advanced features
- Four Quadrant VI Source/Measure
- Ganging capability for extended current range
- 4:1 SmartMux
- Differential Vmeas
- +/-20 V / 300 mA, +/- 60 V / 100 Ma
- AWG and Digitizer Functions
VI1x - Precision Voltage/Current Source and Measurement
VI1xTM
Precision voltage / current source and measurement with advanced features
- V/I source mode
- AWG and digitizer functions
- Time measurement
- Differential voltage measurement
- Timers, triggers and gates
- Alarms
DPIN-96 - Digital and Mixed-Signal Devices
DPIN-96TM
High-value solution for testing digital and mixed-signal devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
GX1x - General Purpose Digital Instrument
GX1xTM
General purpose digital instrument for digital SOC, analog SOC and MCU digital testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HSIx - High-Performance SerDes Test
HSI1xTM
Scalable, cost-efficient solution for high-performance SerDes test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x - High-Speed Solution for SerDes/LVDS/MIPI
HSI2xTM
High-speed solution for SerDes /LVDS /MIPI interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI3x - High-Speed Multisite Solution for SerDes/LVDS/MIPI
HSI3xTM
High-speed Multisite Solution for SerDes /LVDS /MIPI interfaces
- Optimized for testing clock embedded and clock-forward serial interfaces
- Ensures robust performance where bandwidth, power, and signal integrity matter most
- Seamless connectivity across critical system components
HSIO - 8 Lane Serdes for High-Speed Serial Interfaces
HSIOTM
8 lane SerDes instrument for testing of high-speed serial interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memories
MP1x - LVDS Port and DDR Memory Test
MP1xTM
Optimized solution for LVDS port and DDR memory port test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
PD1x/PD2x - Ultra-High Definition Display Driver ICs
PD1xTM/ PD2xTM
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PD3x- High Density Digitizer
PD3xTM
Test solution for ultra-high definition display driver ICs
- 320 channels per board
- Low Voltage High Accuracy Measurement
- Active Load Support for Better Test Coverage
- Per Pin Comparator, TMU, PMU provides Faster Test Time for Higher Throughput
- Integrated Digital Use Model for Faster Time to Yield
DCTMx - Precision Data Converter Test
DCTMxTM
Precision data converter test module
- Precision linearity to 1 ppm
- Single-ended, differential, and pseudo-differential connection
- Testing ADCs and DACs, and class-D amplifiers with a single instrument
DIGHB - Hummingbird Digitizer
DIGHBTM
Hummingbird digitizer
- Four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer
- Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
- Offers an analog bandwidth of up to 800 MHz
- DIGHB is supported on PAx and Diamondx
Multiwave - Multi-site and Concurrent Testing
MultiwaveTM
Highly integrated mixed-signal instrument for multi-site and concurrent testing
- Wide bandwidth analog source
- Wide bandwidth analog capture
- Flexible triggering
- High-precision PMU
- Protected I/O channels
- Simpler test boards
- Mixed-signal software support
RedDragon RF - 5G NR FR1/FR2, mmWave and Wi-Fi
RedDragon RFTM
Test Module for 5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7
- Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz
- Immediate Wi-Fi 6/6E/7 including 7.126 GHz band
- Building blocks for 5G NR FR2 mmWave 23.45 – 48.5 GHz
- Configurable with up to 32 Universal RF ports
- Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure
- Noise source available on all ports
- RF Harmonic measure capability from 8 to 18 GHz using HMM
- 3 Channel AWG with Envelop Tracking Option
DragonRF - Source and Receive with Scalar and Vector Measure
DragonRFTM
Test Module RF source and receive with scalar and vector measure
- Extensive suite of capabilities designed to provide the lowest cost of test without any compromise in RF test performance
- Innovative flexible architecture enables scalable configurations with optimal return on investment without trade-off in test coverage or test time
- Configurable with 16 or 32 Vector RF ports
- 6 GHz RF modulated source and 8 GHz RF measure
- <1 ms RF settling time on level and frequency change
- Quad-site and octal-site RF source with single and dual synthesizer respectively
- Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements.
- Each receiver is connected to a digitizer with 14 bit @ 105 Msps
- Full modulation capability using SWG instrument providing 16 bits @ 250 Msps
- Swept S-parameter capability
- Servo loop tracking
- Real time Dynamic Range Enhancement
Expertise
Learn more about our Semiconductor ATE Solutions
