cViper
High Performance Probe Head for High Volume Production Test
Low Loop Inductance and High Bandwidth
cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
Life cycle up to 1M and field replaceable individual probes.
Key Features
Temperature
Temperature range -55 ̊C to +155 ̊C.
Packages
Wafer-level chip scale package. Singulated devices, wafer probe or wafer-level chip scale test.
Cleaning Cycle
Probe cleaning 20,000 to 50,000.
Adaptable
Adaptable to wafer-level probing and singulated device testing for debug and characterization.
Reduced Spares Inventory
Optimized probe capability.
Variety of Contact Materials
Resistance stability and longer useable life.
Contact Sales
Complete our contact form.
Expertise
Learn more about our Interface Solutions
