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LX Test System

20 Instrument Slots, up 256 Digital Pins

The LX configuration is available in a low-cost engineering configuration featuring a limited function stand to minimize costs for engineering deployments, or as a complete production configuration. The production configuration features a full-function manipulator and docking mechanics. The LX Test System offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.

The LX is part of the X-Series which offer three different configurations, all based off the same instrumentation, software, system architecture and DUT interface. The major difference between the various configurations is the slots available for instrumentation.

Cohu LX Semiconductor ATE Test System
  • Highlights

    • Up to 256 digital pins
    • Air cooled
    • Coherent and low noise architecture
    • Support for high power options
    • Low “0” pin cost

  • Key Features

    • Market leading 0 pin infrastructure costs designed for mixed signal testing
    • Cost effective, incremental investment
    • Program and DUT site compatibility across the entire platform
    • RF port scalability to 40 ports and 8 GHz (18 GHz with Scalar Frequency Extender)
    • Full featured mixed signal digital pins, up to 256
    • Tester-independent feature-rich software environment
    • Broad range of DC instruments
    • DSP instruments support both modulation and DUT-centric testing
  • Architecture

    • Unique architecture that provides testing with best UPH/$ and highest quality
    • Small form-factor
    • Air cooled architecture and instruments
    • Energy efficient, low power consumption
  • Applications

    • Power management
    • Audio: CODECS, amplifiers
    • Printer drivers and motor controllers
    • DSP: digital, mixed signal, analog
    • Converters: precision, high speed, embedded and audio
    • Application processor


Learn more about our Semiconductor ATE Solutions