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X-Series Instrumentation

The X-Series Platform provides a wide range of production proven resources dedicated to providing the best test solutions for optimal testing of DSP, power, automotive, mixed signal and RF applications.

DCTM
Precision Data Converter Test Module

  • Precision linearity to 1 ppm
  • Single-ended, differential, and pseudo-differential connection
  • Testing ADCs and DACs, and class-D amplifiers with a single instrument

FCS

2 Channel Floating Current Source for power management devices

  • Up to 100 V offset from ground, with up to 20 A per channel
  • Paralleling capability for up to 200 A

HCOVI

8 Channel High Current VI general purpose DC

  • Main DUT power for medium to high current RF wireless, DSP and communication devices
  • Full four quadrant operation with high current capabilities of 1 A per channel.
  • Paralleling capability for up to 8 A per instrument is available
OVI
8 Channel VI general purpose DC
  • Low current DUT power or versatile VI capability
  • Full four quadrant operation
  • Up to 550 mA per channel over a range of +/- 16 V, and ripple input

PPVI

2 Channel Pulsed Power VI for applications requiring higher power

  • Full four quadrant operation providing pulsed current up to 10 A per channel over a range of +/-100 V
  • Auto sequencer, differential mode and ripple inputs

QFVI

4 Channel Floating VI for applications requiring higher power, floating VI

  • Full four quadrant operation providing pulsed current up to 5 A per channel over a range of +/- 60 V
  • Can be internally paralleled for operation up to 20 A and can be stacked up to 240 V
  • Auto sequencer, meter per-pin and ripple input

VI16

16 VI general purpose VI

  • Full four quadrant operation providing up to 100 mA per channel over a range of +/- 16 V.
  • High voltage options offer auto sequencing, synchronization bus, differential mode, and ripple inputs

FX Digital

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

AWG-HR

High Resolution Arbitrary Waveform Generator

  • Dual channel, 24 Bit, 768 KSPS high resolution arbitrary waveform generator

DIG-HR

High Resolution Waveform Digitizer

  • Dual channel, 16 Bit, 500 KSPS high

SWG

Sequenced Waveform Generator

  • Dual channel, 16 Bit, 250 MSPS sequential and arbitrary waveform generator

AWG-HSB

High Speed Arbitrary Waveform Generator

  • Dual channel, 16 bit, 250 MSPS arbitrary waveform generator

DIG-HSB

High Speed Waveform Generator

  • Dual channel, 14 bit, 105 MSPS arbitrary waveform generator

XRF

RF capability of the X-Series Platform

  • Dynamic Range >90 db using the Dynamic Range Enhancement (DRE) feature
  • Faster test time • Faster correlation to bench data
  • Improved yield • Wide IF Bandwidth 100Mhz enables single capture acquisition for faster test time
  • Faster test times and throughput with Real-time Digital Signal Processing with FPGA based solution
  • Universal port performance available at all DUT I/O pins with 16 Bi-directional Vector Capable Ports
  • Fully automated calibration process

Kestrel

Radar Test Solution

  • Radar Test solution for Q-band and E-band
  • Simple installation with no system modifications required
  • Supported on X-Series test systems
  • Proven solution for stringent automotive applications
  • annual calibration cycles
  • Wide range of source and measure levels

QTMP

Quad time measurement processor

  • Four independent time measurement channels per board
  • Each channel has its own direct path to DUT which can be programmed over 3 voltage ranges and 3 selectable filters

FX-TMP

FX Time Measurement instrument

  • Single time measurement per channel per board
  • Connects to the DUT through any FX digital pin or its own direct path
Cohu Semiconductor ATE
  • AWG-HR – high resolution arbitrary waveform generator
  • AWG-HSG – high speed arbitrary waveform generator
  • DCTM – data converter test module
  • DIG-HR – high resolution waveform digitizer
  • DIG-HSG – high speed waveform digitizer
  • FCS – floating current source
  • FX Digital – powerful, full featured digital pin
  • FX-TMP – FX time measurement instrument
  • HCOVI – high current VI
  • HVVI – high voltage VI
  • Krestel – radar Test solution for Q-band and E-band
  • OVI – octal VI
  • PPVI – pulsed power VI
  • VIS16 – 16 channel general purpose VI
  • QFVI – quad floating VI
  • QTMP – quad time measurement instrument
  • XRF – RF subsystem

Expertise

Learn more about our Semiconductor ATE Solutions