MATRiX™ thermal pick-and-place test handler has a highly flexible test site configuration that’s well suited for a wide range of test applications. It provides full temperature control in extreme environmental conditions from –55°C to +175°C.
High Parallel Tri-Temp Pick-and-Place Handler
The MATRiX thermal test handler highly flexible test site configuration is well suited for analog ICs with short test times and high-throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements.
Featuring Cohu’s unique T-Core active thermal control (ATC) technology dynamically removing heat from devices during test to maintain thermal control, minimizing test time and yield loss. T-Core is a field upgradeable option.
The MATRix also features Cohu’s DI-Core Data Intelligence System providing real-time equipment monitoring and data analytics for Industry 4.0/Factory Automation and NV-Core Inspection and Metrology technology.
The MATRiX enables customers to reuse existing load boards, including boards made for competitors’ legacy handlers. The MATRiX offers a variety of options, upgrades, and retrofits to configure the product to customer applications while addressing evolving requirements for Industry 4.0.
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Parallelism x1 up to x32
Chamberless Open Architecture
Available Options
- High Contactor Force
- Ionization
- Factory Automation
- Test Site Pitches
- MEMS: PTU, Acoustic and Magnetometer
Unique Inspection Options
- Aquilae HR Sidewall: Micro-scale visible defect inspection down to 5 µm
- Aquilae Infrared: Inner cracks detection on silicon devices
- 3D Flex® Vision: True 3D inspection for Balls/Bumps
- ViewMap
Data Analytics Options
DI-Core Data Intelligence System
- Real-time equipment monitoring and management
- Preventative Maintenance
- Central Recipe Management
- Knowledge Database and Unified Reports
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